AUGER AND XPS ANALYSIS OF THE TIO SI INTE RFACE/

Authors
GRIGOROV K SPORKEN R RIGA J CAUDANO R BOUCHIER D GRIGOROV GI
Citation
K. Grigorov et al., AUGER AND XPS ANALYSIS OF THE TIO SI INTE RFACE/, Le Vide, 52(279), 1996, pp. 121-124
Citations number
4
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Journal title
Le Vide → ACNP
ISSN journal
12660167
Volume
52
Issue
279
Year of publication
1996
Pages
121 - 124
Database
ISI
SICI code
1266-0167(1996)52:279<121:AAXAOT>2.0.ZU;2-F