Jy. Juang et al., DIMENSIONALITY AND KOSTERLITZ-THOULESS TRANSITION IN SINGLE GRAIN TL-2223 SUPERCONDUCTING THIN-FILMS, Zhongguo wuli xuekan, 34(2), 1996, pp. 263-270
Tl2Ba2Ca2Cu3O10+x (Tl-2223) superconducting films with microstructure
consisted of submillimeter size grains combining with reactive ion etc
hing technique, has enabled us to investigate the transport properties
of this material in a more controllable manner. Both conductivity flu
ctuations based on the Aslamazov-Larkin theory and the Kosterlitz-Thou
less transitions were studied to delineate the two dimensional nature
of the material. It was found that, depending on the substrate used, t
he effective thickness of critical fluctuation and the detailed featur
es of the K-T transition were very different. For films deposited on L
aAlO3(100) substrates, the effective thickness of critical fluctuation
is about 35 Angstrom compared to a value of 17.5 Angstrom obtained fo
r films deposited on MgO(100) substrate, roughly equal to the c-axis l
attice constant and the distance between the trilayer CuO2 planes, res
pectively. The effective vortex dielectric constant measuring the corr
elations between vortex pairs near K-T transition were estimated to be
3.0 and 1.6 for films on LaAlO3 and on MgO, repectively. Possible mec
hanisms based on the defect structures are proposed to account for the
observed results.