The phonon transmission from atomic clean Si(111) surfaces into liquid
helium was studied by the phonon pulse technique. Reflection experime
nts and angular resolving transmission experiments were performed to m
easure the absolute value of the transmission coefficient and its depe
ndence on the phonon emission angle into the solid. A coefficient of t
he order of 1% was obtained by a chemical preparation method. We found
that the observed anomalous transmission is caused by mass defects. L
ocal inhomogeneities caused by the deposition of water molecules on th
e surface could be visualised by an enhanced transmission.