CONTRAST OF HOLZ LINES IN ENERGY-FILTERED CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS FROM SILICON - COMMENT

Authors
ALLEN LJ JOSEFSSON TW
Citation
Lj. Allen et Tw. Josefsson, CONTRAST OF HOLZ LINES IN ENERGY-FILTERED CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS FROM SILICON - COMMENT, Acta crystallographica. Section A, Foundations of crystallography, 52, 1996, pp. 497-498
Citations number
13
Categorie Soggetti
Crystallography
Journal title
Acta crystallographica. Section A, Foundations of crystallography → ACNP
ISSN journal
01087673
Volume
52
Year of publication
1996
Part
3
Pages
497 - 498
Database
ISI
SICI code
0108-7673(1996)52:<497:COHLIE>2.0.ZU;2-U
Abstract
Whilst investigating higher-order Laue-zone (HOLZ) lines in convergent -beam electron diffraction (CBED) patterns for silicon near low-indexe d zone axes, Lehmpfuhl, Krahl & Uchida [Acta Cryst. (1995), A51, 504-5 14] concluded that there is a strong anisotropy in the Debye-Waller fa ctor at room temperature. It is demonstrated here that no such anisotr opy is implied by their experimental results.