Pb(Fe1/2Ta1/2)O-3 (PFT) thin films with the perovskite structure have
been prepared successfully on Si(III) substrates by a sol-gel process.
The crystallinity of the thin films was characterized by X-ray diffra
ction and their micro structures were observed by transmission electro
n microscopy (TEM). It was found that the perovskite phase could only
be formed with an excess lead content over stoichiometric composition
and primary perovskite phase with a strong (110) orientation was obtai
ned at annealing temperatures between 680 degrees C and 730 degrees C.