COMPARING FAILURE TIMES VIA DIFFUSION-MODELS AND LIKELIHOOD RATIO ORDERING

Authors
DICRESCENZO A RICCIARDI LM
Citation
A. Dicrescenzo et Lm. Ricciardi, COMPARING FAILURE TIMES VIA DIFFUSION-MODELS AND LIKELIHOOD RATIO ORDERING, IEICE transactions on fundamentals of electronics, communications and computer science, E79A(9), 1996, pp. 1429-1432
Citations number
9
Categorie Soggetti
Engineering, Eletrical & Electronic","Computer Science Hardware & Architecture","Computer Science Information Systems
Journal title
IEICE transactions on fundamentals of electronics, communications and computer science → ACNP
ISSN journal
09168508
Volume
E79A
Issue
9
Year of publication
1996
Pages
1429 - 1432
Database
ISI
SICI code
0916-8508(1996)E79A:9<1429:CFTVDA>2.0.ZU;2-F
Abstract
For two devices whose quality is described by non-negative one-dimensi onal time-homogeneous diffusion processes of the Wiener and Ornstein-U hlenbeck types sufficient conditions are given such that their failure times, modeled as first-passage times through the zero state, are ord ered according to the likelihood ratio ordering.