OPTICAL ANISOTROPIES IN STRAINED SI SIGE SYSTEMS/

Citation
J. Olajos et al., OPTICAL ANISOTROPIES IN STRAINED SI SIGE SYSTEMS/, Applied surface science, 102, 1996, pp. 283-287
Citations number
16
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
102
Year of publication
1996
Pages
283 - 287
Database
ISI
SICI code
0169-4332(1996)102:<283:OAISSS>2.0.ZU;2-A
Abstract
Optical anisotropies were studied in two types of Si/Ge systems: strai n-adjusted superlattices, and thin Ge quantum wells on Si. For the sup erlattices, investigations of the polarization dependence showed that the topmost valence band is of heavy-hole character. For the Ge monola yer quantum wells, the optical transitions were identified as a no-pho non transition and a TO-replica. Furthermore, the symmetry of the inte rmediate state over which the transitions take place at the zone-cente r was identified.