Wx. Ni et al., INTENSE PHOTOLUMINESCENCE OBSERVED IN MODULATION-DOPED SI SIGE QUANTUM-WELL STRUCTURES/, Applied surface science, 102, 1996, pp. 298-302
Citations number
12
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
p-type modulation doped wide Si/SiGe quantum well (QW) structures have
been grown using a solid-source molecular beam epitaxy system. Very i
ntense SiGe-related photoluminescence (PL) peaks, more than an order o
f magnitude stronger than for undoped SiGe QW structures, were observe
d from these samples. The increased PL intensity is believed to be due
to the electron confinement in the vicinity of the QW, which enhances
its excitonic recombination process in the Sice layer, and it also in
dicates high crystalline quality of tile grown materials with low inco
rporation of non-radiative defects. The luminescence properties of the
se modulation doped SiGe well structures have been studied under vario
us excitation and measurement temperature conditions. Differences in P
L spectra from MBE and some CVD grown Si/SiGe samples are discussed.