INTENSE PHOTOLUMINESCENCE OBSERVED IN MODULATION-DOPED SI SIGE QUANTUM-WELL STRUCTURES/

Citation
Wx. Ni et al., INTENSE PHOTOLUMINESCENCE OBSERVED IN MODULATION-DOPED SI SIGE QUANTUM-WELL STRUCTURES/, Applied surface science, 102, 1996, pp. 298-302
Citations number
12
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
102
Year of publication
1996
Pages
298 - 302
Database
ISI
SICI code
0169-4332(1996)102:<298:IPOIMS>2.0.ZU;2-U
Abstract
p-type modulation doped wide Si/SiGe quantum well (QW) structures have been grown using a solid-source molecular beam epitaxy system. Very i ntense SiGe-related photoluminescence (PL) peaks, more than an order o f magnitude stronger than for undoped SiGe QW structures, were observe d from these samples. The increased PL intensity is believed to be due to the electron confinement in the vicinity of the QW, which enhances its excitonic recombination process in the Sice layer, and it also in dicates high crystalline quality of tile grown materials with low inco rporation of non-radiative defects. The luminescence properties of the se modulation doped SiGe well structures have been studied under vario us excitation and measurement temperature conditions. Differences in P L spectra from MBE and some CVD grown Si/SiGe samples are discussed.