IR-SENSOR ARRAY FABRICATION IN PB1-XSNXSE-ON-SI HETEROSTRUCTURES

Citation
J. John et al., IR-SENSOR ARRAY FABRICATION IN PB1-XSNXSE-ON-SI HETEROSTRUCTURES, Applied surface science, 102, 1996, pp. 346-349
Citations number
7
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
102
Year of publication
1996
Pages
346 - 349
Database
ISI
SICI code
0169-4332(1996)102:<346:IAFIPH>2.0.ZU;2-J
Abstract
Large line or area arrays of photovoltaic infrared sensors are desired for thermal imaging and spectroscopic applications. The sensor arrays should be arranged on Si-substrates because of size, costs and the po ssibility to integrate the read-out electronics of large arrays direct ly into the Si-substrate. We therefore grow narrow gap Pb1-xSnxSe laye rs by molecular beam epitaxy (MBE) on Si(111)-substrates. A CaF2 epita xial buffer layer is used for compatibility reasons. Photovoltaic infr ared sensor arrays for the 8-12 mu m atmospheric window are fabricated in the 2-4 mu m thick layers by photolithographic techniques with 8 m ask levels and 6 simple wet etching steps. The operability of the sens or arrays is demonstrated by recording thermal images with a simple ca mera.