AN ELECTRONIC PATTERN SPECKLE SHEARING INTERFEROMETER FOR THE MEASUREMENT OF SURFACE SLOPE VARIATIONS OF 3-DIMENSIONAL OBJECTS

Authors
RASTOGI PK
Citation
Pk. Rastogi, AN ELECTRONIC PATTERN SPECKLE SHEARING INTERFEROMETER FOR THE MEASUREMENT OF SURFACE SLOPE VARIATIONS OF 3-DIMENSIONAL OBJECTS, Optics and lasers in engineering, 26(2-3), 1997, pp. 93-100
Citations number
11
Categorie Soggetti
Optics
Journal title
Optics and lasers in engineering → ACNP
ISSN journal
01438166
Volume
26
Issue
2-3
Year of publication
1997
Pages
93 - 100
Database
ISI
SICI code
0143-8166(1997)26:2-3<93:AEPSSI>2.0.ZU;2-T
Abstract
An electronic pattern speckle shearing interferometer to measure the s patial derivatives of the surface topography of an arbitrary shaped ob ject is described. The method provides accuracy and repeatibility. The sensitivity of the contour planes can be varied over a wide range. Co pyright (C) 1996 Elsevier Science Ltd.