Different gases (Ar, H-2, N-2 and O-2) were used for plasma treatments
of polyethersulphone (PES) performed in an electron cyclotron resonan
ce (ECR) plasma. The effect of the gas pressure on the chemical modifi
cation of the PES surface during plasma treatment was investigated by
X-ray photoelectron spectroscopy (XPS). The experimental set-up of the
plasma chamber connected via an ultra high vacuum transfer to a surfa
ce analysis system allows to measure well-defined surface modification
s. The experiments have shown that the plasma-polymer interaction in t
he topmost surface region of the polymer increase with decreasing gas
pressure. At low gas pressures (p < 10(-3) mbar) the plasma attacks fi
rst the polar bonds of the sulphonic group, this results in the reduct
ion to sulphide of all sulphonic groups (-SO2- --> -S-) in the study s
tate. This effect decreases progressively for higher gas pressures(p >
10(-3) mbar) and is no more observable at p = 10(-1) mbar. In additio
n to the amount of sulfide formation also the time scale of sulfide fo
rmation varies with the gas pressure. The time constant for the sulfid
e formation change from tenth of seconds to about one minute for 10(-4
) to 10(-2) mbar gas pressure, respectively. The thickness of the surf
ace layer in which sulphide is formed depends on the pressure and is a
t least equal to the XPS probing depth of about 100 Angstrom for p < 1
0(-3) mbar. The incorporation of new chemical functionalities by react
ive gas plasma treatments is similar for all gas pressures. Difference
s were observed in the amount of adsorbed species at the top most surf
ace layer. The higher the gas pressure is, the higher the content of a
dsorbed species. The results are discussed in function of the flux phi
(i), and the kinetic energy E(kin) of the ions interacting with the po
lymer surface.