Co-fabrication of polysilicon microstructures with CMOS electronics en
ables monolithic inertial. sensors to be fabricated. Correlations are
well established between the deposition, doping, and annealing conditi
ons of LPCVD polysilicon and its mechanical properties, such as residu
al Strain, strain gradient, and Young's modulus. Surface passivations
for alleviating stiction have been demonstrated recently that greatly
reduce the tendency for polysilicon microstructures to adhere to adjac
ent surfaces when dried after release by wet etching and rinsing, or w
hen brought into contact due to mechanical shock during use. Sigma-del
ta control strategies are attractive for linearizing closed-loop senso
rs and are well suited to implementation in CMOS. Basic design princip
les for sense elements and electromechanical actuation in a single str
uctural layer of polysilicon have emerged rapidly in the past several
years. Monolithic polysilicon integrated sensors for the X, Y, and Z c
omponents of linear acceleration, angular rate, and angular accelerati
on have been demonstrated using the BiMEMS process of Analog Devices,
Inc. Mechanical suspensions, electrostatic actuators and capacitive pi
ckoffs, and interface- and control-circuit building blocks are all por
table to alternative integrated technologies that share the basic char
acteristic of thin, laminar suspended microstructures.