STUDY OF LAYER DISORDER AND MICROSTRUCTURAL PARAMETERS OF MOLYBDENUM-TUNGSTEN MIXED SULFO-SELENIDE MO0.5W0.5SXSE2-X 0-LESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-2) BY X-RAY-LINE PROFILE ANALYSIS

Authors
PALIT D SRIVASTAVA SK CHAKRAVORTI MC SAMANTARAY BK
Citation
D. Palit et al., STUDY OF LAYER DISORDER AND MICROSTRUCTURAL PARAMETERS OF MOLYBDENUM-TUNGSTEN MIXED SULFO-SELENIDE MO0.5W0.5SXSE2-X 0-LESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-2) BY X-RAY-LINE PROFILE ANALYSIS, Journal of materials science letters, 15(18), 1996, pp. 1636-1637
Citations number
17
Categorie Soggetti
Material Science
Journal title
Journal of materials science letters → ACNP
ISSN journal
02618028
Volume
15
Issue
18
Year of publication
1996
Pages
1636 - 1637
Database
ISI
SICI code
0261-8028(1996)15:18<1636:SOLDAM>2.0.ZU;2-W