THERMAL CHARACTERIZATION BY PHOTODEFLECTION METHOD

Authors
BERTOLOTTI M LIAKHOU GL LIVOTI R SIBILIA C
Citation
M. Bertolotti et al., THERMAL CHARACTERIZATION BY PHOTODEFLECTION METHOD, Journal of thermal analysis, 47(1), 1996, pp. 51-65
Citations number
15
Categorie Soggetti
Chemistry Analytical
Journal title
Journal of thermal analysis → ACNP
ISSN journal
03684466
Volume
47
Issue
1
Year of publication
1996
Pages
51 - 65
Database
ISI
SICI code
0368-4466(1996)47:1<51:TCBPM>2.0.ZU;2-B
Abstract
The photodeflection technique is useful not only for thermal diffusivi ty measurements but also to supply a thermal imaging system. The exper imental setup and the basic theoretical aspects for determining the te mperature profile are discussed together with the experimental results on a semiconductor laser diode.