THERMAL CHARACTERIZATION OF HIGH T-C SUPERCONDUCTORS THROUGH THE PHOTODEFLECTION METHOD

Authors
BERTOLOTTI M LIAKHOU G RICCIARDIELLO FG LIVOTI R PAOLONI S SIBILIA C TAMPIERI A SPARVIERI N
Citation
M. Bertolotti et al., THERMAL CHARACTERIZATION OF HIGH T-C SUPERCONDUCTORS THROUGH THE PHOTODEFLECTION METHOD, Journal of thermal analysis, 47(1), 1996, pp. 67-74
Citations number
9
Categorie Soggetti
Chemistry Analytical
Journal title
Journal of thermal analysis → ACNP
ISSN journal
03684466
Volume
47
Issue
1
Year of publication
1996
Pages
67 - 74
Database
ISI
SICI code
0368-4466(1996)47:1<67:TCOHTS>2.0.ZU;2-D
Abstract
The photothermal deflection method has been used for thermal diffusivi ty measurements on bulk YBCO and BISCCO high T-c superconductors. A cr yostat set up is used to perform photothermal measurements from room t emperature down to 77 K.