STRESS EFFECTS IN FERROELECTRIC THIN-FILMS

An uneven distribution of stress in the thickness direction was introd uced into Landau theory to investigate the behavior of phase transform ations of ferroelectric thin films. Extensive stress induced a decreas e of Curie temperature and polarization while an increase of susceptib ility near the surface. Compressive stress induced an increase of Curi e temperature and polarization and a decrease of susceptibility near t he surface. There exist size-driven and stress-driven phase transforma tions only for the extensive stress cases. Copyright (C) 1996 Elsevier Science Ltd