R. Cooper et al., ABSOLUTE FLUORESCENCE YIELDS FROM ELECTRON-IRRADIATED GASES .2. KRF-ASTERISK AND XEF-ASTERISK, Journal of physical chemistry, 100(40), 1996, pp. 16195-16200
Absolute total fluorescence yields for the KrF(B,C) and XeF*(B,C) sta
tes have been determined from pulse-electron-irradiated Kr/SF6 and Xe/
SF6 gas mixtures. By application of established formation and quenchin
g mechanisms and rate constants, the KrF yield has been resolved into
its two constituent components, corresponding to exciplex formation b
y excited-state reaction of Kr species and ionic recombination. The in
itial yield of electronically excited krypton atoms that can react wit
h SF6, Kr + SF6 --> KrF* + products, was determined to be G(0)* = 0.7
0 +/- 0.10, while the corresponding three-body ionic recombination rea
ction, Kr-2(+) + SF6- + Kr --> KrF + products, gave G(0)(+) = 1.70 +/
- 0.10. Analogous studies of the XeF emission showed that ionic recom
bination is essentially the only formation pathway, with a calculated
initial fluorescence yield for the reaction Xe-2(+) + SF6- + Xe --> Xe
F + products of G(0)(+) = 0.26 +/- 0.02. The experimental values are
compared to the predictions of current theoretical models, and the imp
ortance of alternative reaction pathways is discussed.