ANGULAR SELECTIVE OPTICAL-PROPERTIES OF THIN-FILMS - MEASUREMENT OF POLAR AND AZIMUTHAL TRANSMITTANCE

Citation
S. Palmer et al., ANGULAR SELECTIVE OPTICAL-PROPERTIES OF THIN-FILMS - MEASUREMENT OF POLAR AND AZIMUTHAL TRANSMITTANCE, Solar energy materials and solar cells, 44(4), 1996, pp. 397-403
Citations number
15
Categorie Soggetti
Energy & Fuels","Material Science
ISSN journal
09270248
Volume
44
Issue
4
Year of publication
1996
Pages
397 - 403
Database
ISI
SICI code
0927-0248(1996)44:4<397:ASOOT->2.0.ZU;2-Z
Abstract
A new instrument for automatic recordings of angular dependent transmi ttance through thin film samples is described. The output is a polar p lot giving a schematic and convenient overview of the optical performa nce. The usefulness of the instrument and procedures was documented by measurements on an angular selective Cr film prepared by oblique angl e evaporation.