An investigation of the atomic and electronic defectuality in Sm-doped Mg2SiO4, by high temperature electrical conductivity measurements

Authors
MORLOTTI R OTTONELLO G SCIUTO P F
Citation
R. Morlotti et al., An investigation of the atomic and electronic defectuality in Sm-doped Mg2SiO4, by high temperature electrical conductivity measurements, Mineralogica et petrographica acta , 37, 1994, pp. 219-228
Journal title
Mineralogica et petrographica acta → ACNP
ISSN journal
05401437
Volume
37
Year of publication
1994
Pages
219 - 228
Database
ACNP
SICI code