A BAYES APPROACH TO STEP-STRESS ACCELERATED LIFE TESTING

Citation
Jr. Vandorp et al., A BAYES APPROACH TO STEP-STRESS ACCELERATED LIFE TESTING, IEEE transactions on reliability, 45(3), 1996, pp. 491-498
Citations number
19
Categorie Soggetti
Computer Sciences","Engineering, Eletrical & Electronic","Computer Science Hardware & Architecture","Computer Science Software Graphycs Programming
ISSN journal
00189529
Volume
45
Issue
3
Year of publication
1996
Pages
491 - 498
Database
ISI
SICI code
0018-9529(1996)45:3<491:ABATSA>2.0.ZU;2-L
Abstract
Summ. & Conclusions - This paper develops a Raves model for step-stres s accelerated life testing. The failure times at each stress level are exponentially distributed, but strict adherence to a time-transformat ion function is not required. Rather, prior information is used to def ine indirectly a multivariate prior distribution for the failure rates at the various stress levels. Our prior distribution preserves the na tural ordering of the failure rates in both the prior gr posterior est imates. Methods are developed for Bayes point estimates as well as for making probability statements for use-stress life parameters. The app roach is illustrated with an example.