THE CAPACITIVE ORIGIN OF THE PICOSECOND ELECTRICAL TRANSIENTS DETECTED BY A PHOTOCONDUCTIVELY GATED SCANNING TUNNELING MICROSCOPE

Authors
GROENEVELD RHM VANKEMPEN H
Citation
Rhm. Groeneveld et H. Vankempen, THE CAPACITIVE ORIGIN OF THE PICOSECOND ELECTRICAL TRANSIENTS DETECTED BY A PHOTOCONDUCTIVELY GATED SCANNING TUNNELING MICROSCOPE, Applied physics letters, 69(15), 1996, pp. 2294-2296
Citations number
10
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
69
Issue
15
Year of publication
1996
Pages
2294 - 2296
Database
ISI
SICI code
0003-6951(1996)69:15<2294:TCOOTP>2.0.ZU;2-G
Abstract
We present experimental results and numerical calculations on the dete ction of picosecond electrical transients by a photoconductively gated scanning tunneling microscope. We show that the transient signal dete cted in the tunneling regime is coupled by the 5 fF geometric capacita nce between tip and sample leading to a correlation current that is li nearly proportional to the tunnel conductance. (C) 1996 American Insti tute of Physics.