COLLISIONAL EXCITATION X-RAY LASERS - TOWARD A COMPACT X-RAY SOURCE

Citation
Y. Kato et al., COLLISIONAL EXCITATION X-RAY LASERS - TOWARD A COMPACT X-RAY SOURCE, Progress in crystal growth and characterization of materials, 33(1-3), 1996, pp. 255-260
Citations number
14
Categorie Soggetti
Crystallography,"Materials Science, Characterization & Testing
ISSN journal
09608974
Volume
33
Issue
1-3
Year of publication
1996
Pages
255 - 260
Database
ISI
SICI code
0960-8974(1996)33:1-3<255:CEXL-T>2.0.ZU;2-J
Abstract
Soft x-ray amplification has been observed over the wavelengths of 14. 3 nm - 4.6 nm in nickel-like ions of various atoms with the atomic num bers of Z = 47 (Ag) to 72 (Hf). These results were obtained by irradia tion of a preformed plasma with a short duration laser pulse, Observat ion of polarization of the amplified soft x-ray radiation infers that the population inversion is strongly affected by the trapping of the r esonance radiation. Conditions for increasing the population inversion density by pumping with shorter-duration laser pulses due to transien t effects are examined.