DESIGN AND TESTS OF THE NEW PARTIALLY-IONIZED BEAM SOURCE

Citation
Sk. Koh et al., DESIGN AND TESTS OF THE NEW PARTIALLY-IONIZED BEAM SOURCE, Review of scientific instruments, 67(12), 1996, pp. 4114-4116
Citations number
10
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
67
Issue
12
Year of publication
1996
Pages
4114 - 4116
Database
ISI
SICI code
0034-6748(1996)67:12<4114:DATOTN>2.0.ZU;2-O
Abstract
We developed and evaluated a new partially ionized beam (PIB) source t o deposit high quality Cu films. The novelty of the PIB source lies in the fact that the crucible and ionization parts are spaced in one cyl indrical shell to make its structure compact and to get a uniform beam profile, but their electric circuits are not separated. In this artic le, we report the characteristics of the PIB source, such as voltage-a mpere characteristics of the crucible and ionization parts, Cu+ ion be am uniformity with a change of the ionization currents, and deposition rate. (C) 1996 American Institute of Physics.