The present study investigates the effect of ion energy in the form of
acceleration potential on the structure of ion beam deposited a-C:H f
ilms using Raman spectroscopy, FTIR spectroscopy and profilometry. The
results indicate that for low acceleration potentials (100-200 V), th
e sp(2) fraction of the film becomes more ordered as the acceleration
potential increases. However, FTIR indicates that the hydrogen bonding
in the film is unaffected. For mid-range acceleration potentials (200
-800 V) the film structure remains stable, then, as the acceleration p
otential is increased above 800 V there is a further increase in the o
rder of the sp(2) fraction in the films and a change in the hydrogen b
onding in the film. These structure changes suggest that two separate
energy dependent processes effect the structure of IBD a-C:H; a densif
ication/relaxation process at low acceleration potentials and ion dama
ge/sputtering processes at higher acceleration potentials.