Diamond films grown using a thermal plasma technique are characterized
using a variety of techniques. The relationships between the chemistr
y, morphology, and mechanical properties are explored using microscopy
, Raman spectroscopy, Anger electron spectroscopy, and X-ray photoelec
tron spectroscopy. The characteristics of films grown using two differ
ent nucleation enhancement techniques are shown. Films grown using hig
h methane concentrations at the beginning of growth produce large grai
ned columnar films, whereas films grown on substrates which have been
treated with a diamond polishing step show nanocrystalline structures.
Variations in sp(3) and sp(2) bonding and peak shifts are tracked thr
ough the thickness of the film, corresponding to variations in the met
hane concentration during growth. Stresses an measured using peak shif
ts and beam bending techniques. Adhesion is tested using indentations,
and is shown to increase both as growth temperatures and surface roug
hness increase.