N. Bozzolo et al., SPATIAL-DISTRIBUTION OF STACKING-FAULTS AND MICROTWINS IN ISOLATED CRYSTALS AND TEXTURED DIAMOND FILMS, DIAMOND AND RELATED MATERIALS, 5(12), 1996, pp. 1532-1535
A relationship between the planar defect distribution observed by TEM
and the surface topography observed by SEM is verified for both near [
100] and near [111] textured diamond films. This relationship leads to
precise the description of the microstructure by use of pyramidal cry
stalline volumes which are defined by the homothetical growth of the p
rincipal facets constituting the film surface during the synthesis. De
pending on the facet type, {111} or {100}, these volumes are respectiv
ely filled or free of planar defects. The observations made on texture
d films also allowed estimation of the crystalline quality of isolated
crystals according to their morphology.