This article presents the first attempt to review the recent achieveme
nts in the progress of the new experimental nonlinear optical techniqu
e of studying surface and interfaces of centrosymmetric semiconductors
. This novel method is based on discovered in 60's phenomenon of the d
c-electric-field-induced optical second-harmonic generation (EISHG) at
semiconductor (metal)-electrolyte interfaces that manifests itself in
the modulation of the optical second-harmonic generation (SHG) intens
ity by a dc electric field applied to the surface or interface. In thi
s paper we will present our recent results of experimental and theoret
ical studies of the EISHG phenomenon in the Si-SiO2-Cr MOS structures.
The systematic phenomenological description of EISHG consisting of de
tail electrophysical model of the space charge region (SCR) at the sem
iconductor-dielectric interface and rigorous nonlinear optical model o
f EISHG in SCR is presented also.