O. Benka et al., ELECTRON-EMISSION YIELD OF AL, CU AND AU TARGETS INDUCED BY FAST HYDROGEN AND HELIUM-IONS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 117(4), 1996, pp. 350-356
The electron emission yield gamma ls measured for impact of H+, He+, H
e2+ ions and of electrons on Al, Cu, and Au targets. The ion energy is
between 0.5 MeV (H+) and 4.8 MeV (He2+), the electron energies are ar
ound 1 keV. The bare ion yield is compared with predictions of a model
, which assumes the yield to be proportional to the stopping power and
takes collective electric fields generated by the projectiles into ac
count. The He+ yield is explained by investigating the additional elec
tron production of stripped electrons. It is found that the mean depth
He+ ions penetrate the surface layer without losing their bound elect
ron and is about 60% of the mean escape length of the emitted electron
s.