Ab. Zorin et al., DETECTION OF THE SINGLE-ELECTRON TUNNELING NOISE USING COULOMB-BLOCKADE ELECTROMETER, Czechoslovak journal of Physics, 46, 1996, pp. 2281-2282
We have studied the effect of charge fluctuations in the ultrasmall me
tallic island, associated with quasi-random discrete electron tunnelin
g, on a capacitively coupled Single Electron Tunneling (SET) device. T
heory can explain the experiment where the SET transistor experiences
the shot noise in an inner island of the multi-junction chain.