CHARGE-STATE INSTABILITIES IN THE SINGLE-ELECTRON TRAP

Authors
KRUPENIN VA LOTKHOV SV PRESNOV DE ZORIN AV AHLERS FJ NIEMEYER J SCHERER H WEIMANN T WOLF H
Citation
Va. Krupenin et al., CHARGE-STATE INSTABILITIES IN THE SINGLE-ELECTRON TRAP, Czechoslovak journal of Physics, 46, 1996, pp. 2283-2284
Citations number
7
Categorie Soggetti
Physics
Journal title
Czechoslovak journal of Physics → ACNP
ISSN journal
00114626
Volume
46
Year of publication
1996
Supplement
4
Pages
2283 - 2284
Database
ISI
SICI code
0011-4626(1996)46:<2283:CIITST>2.0.ZU;2-5
Abstract
We have studied the multijunction (N=9) SET trap monitored by a capaci tively coupled SET - electrometer. Two dominating factors leading to t he charge state instabilities al the operating temperature of T=35 mK are found, namely, the background charge fluctuations and the back inf luence of the electrometer upon the trap.