T. Yasuda et al., PULSE MEASUREMENT OF THE I-V CHARACTERISTICS IN BI-2212 INTRINSIC JUNCTIONS, Czechoslovak journal of Physics, 46, 1996, pp. 1265-1266
Current-voltage (I-V) characteristics are studied in the intrinsic Jos
ephson junctions of Bi2Sr2CaCu2Oy single crystals. In order to examine
the influence of self-heating, a current pulse (approximate to 0.2 mu
sec) is applied to the mesas of 40 mu m phi x 0.15 mu m patterned on
the crystal. As a consequence, in contrast to small characteristic vol
tage V-c in the continuous-current measurement, the V-c data is found
comparable to the BCS value. Moreover, the I-V curve is nearly ohmic f
or I>I-c, implying that the nonlinearity under the continuous current
is due to heating. The quasiparticle resistance for T<T-c is also pres
ented by an estimate from the characteristic voltage.