Vy. Kashirin et al., WEAK-LOCALIZATION AND INTERACTION OF ELECTRONS IN MBE DELTA-LESS-THAN-SB-GREATER-THAN-LAYERS IN SI, Czechoslovak journal of Physics, 46, 1996, pp. 2481-2482
Temperature (1.6 - 20 K) and magnetic field (up to 2.5 T) dependences
of quantum corrections to the conductivity and Hall coefficient of Si
epitaxial films containing a delta < Sb >-layer of different sheet den
sity N-Sb are studied. The quantum corrections are due to the effects
of electron weak localization (WL) and electron-electron interaction (
EEI). Analysis of the quantum corrections made it possible to determin
e the temperature dependence of electron phase relaxation time tau(phi
), the spin-orbit interaction time tau(so) and the screening factor F.
It is found that the dependence tau(phi)(T) is determined by the elec
tron-electron scattering processes, tau(phi) proportional to T--p with
p approximate to 1, and an increase in the parameter F with decreasin
g electron concentration n in the delta-layer is related to the specif
ic features of the screening processes in two-dimensional electron sys
tems.