Sa. Rykov et al., LOW-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY AND SPECTROSCOPY OF THEPBSE-CL THIN-FILMS, Czechoslovak journal of Physics, 46, 1996, pp. 2487-2488
Scanning tunneling microscope operating at 4.2 K was used for investig
ation of the surface topography and local energy spectrum of the PbSe:
Cl epitaxial films on BaF2 substrates. The information on the film gro
wth mechanism and the surface topography was obtained. Scanning tunnel
ing spectroscopy experiments at low temperatures showed the features o
f the local electron density in the grains and grain boundaries. The t
unneling spectra of the grains with the average size of 0.1 divided by
0.3 mu m correspond to the bulk material properties. For the first ti
me the information on energy spectrum of the grain boundaries with the
size around 10 nm was obtained. Their local energy spectrum differs f
rom the grains' ones. The local electron density in the grain boundari
es varies also from one point to other.