THERMOELECTRIC VOLTAGE STUDY OF 1T-TAS2 USING TEMPERATURE-DEPENDENT SCANNING TUNNELING SPECTROSCOPY

Citation
Jj. Kim et al., THERMOELECTRIC VOLTAGE STUDY OF 1T-TAS2 USING TEMPERATURE-DEPENDENT SCANNING TUNNELING SPECTROSCOPY, Czechoslovak journal of Physics, 46, 1996, pp. 2599-2600
Citations number
8
Categorie Soggetti
Physics
ISSN journal
00114626
Volume
46
Year of publication
1996
Supplement
5
Pages
2599 - 2600
Database
ISI
SICI code
0011-4626(1996)46:<2599:TVSO1U>2.0.ZU;2-3
Abstract
Using an ultra high vacuum (UHV) scanning tunneling microscope where t he sample is cooled while the tip remains close to room temperature, w e measured the thermoelectric voltage induced by the large thermal gra dient between the tip anti sample. Using tunneling thermometry techniq ue we studied the change of electronic structures of 1T-TaS2 front roo m temperature to 40 K. At the temperature for the nearly commensurate to commensurate transition, we found an abrupt change of tile thermoel ectric power from a very small value to about 0.15 mV/K.