G. Carapella et al., EXTERNAL MAGNETIC-FIELD AND SELF-FIELD EFFECTS IN STACKED LONG JOSEPHSON-JUNCTIONS, Czechoslovak journal of Physics, 46, 1996, pp. 667-668
We have fabricated and tested samples consisting of two long stacked J
osephson junctions with direct access to the intermediate electrode, w
hose thickness is smaller than London penetration depth lambda(L). The
electrodes are patterned so that the junctions can be independently b
iased in the overlap geometry. We report the behaviour of the critical
current of one junction as a function of an applied magnetic field (w
hile the other junction is unbiased) and as a function of the bias cur
rent along the McCumber curve in the other junction. We find strong si
milarity in the two cases and compare the experimental results with nu
merical simulation.