We report on ''Josephson superlattice'' - a stack of junctions consist
ing of a multilayer [Nb(7nm)/Si(2nm)]10 deposited by dc sputtering. T
he silicon barriers are amorphous and Nb sublayers are polycrystalline
. The stacked junctions exhibit both ac and dc Josephson effects. In t
he I-C(B) diffraction pattern there is an extra periodicity of about 2
-3 G in addition to larger period of about 21 G. The shape of I-C(B) c
urve resembles the characteristics obtained on two JJs placed close to
each other and connected in parallel. The possible explanation of thi
s fine structure of the interference pattern is shortly discussed.