Dislocation model of a weak link at an intergrain boundary (IGB) with
the misorientation angle theta is developed with the assumption of ord
er parameter suppression in the regions subjected to strong stresses.
Stress fields at the IGB with randomized dislocations (resulting from
thermal fluctuations) provide a fast (exponential with respect to thet
a) lowering of the critical current. The result agrees with the experi
ments.