ANOMALOUS ELECTRIC CHARACTERISTIC OF LA2-XSRXCUO4 AT X=1 4(N)/

The resistivity of LSCO materials drops sharply at x approximate to 4( -n) from low up to room temperature Anomalous dielectric response of L SCO film at (x approximate to 4-n) and (x approximate to 2x4-n) is fou nd along c axis. The capacitance C t of multi-layer structure Pd/LSCO/ STO/Pd increases at the x values exceeding the capacitance CSTO of Pd/ STO/Pd structure from low to room temperature, where effective dielect ric constant of the conductive normal state is considered to be negati ve. The C-V measurement reveals the existence of ''critical voltage'' in the anomalous dielectric property.