E. Tsui et al., DETERMINATION OF THE QUASI-FERMI-LEVEL SEPARATION IN SINGLE-QUANTUM-WELL P-I-N-DIODES, Journal of applied physics, 80(8), 1996, pp. 4599-4603
The radiative behavior of quantum-well (QW) devices depends upon the q
uasi-Fermi-level separation Delta E(f) induced in the quantum well. We
present a method of obtaining Delta E(f) in absolute units from the e
mission spectra of optically or electrically biased QWs. Emission spec
tra are calibrated by comparison with measurements of the limiting pho
tocurrent. A theoretical model is then used to separate out the effect
s of carrier generation rate and field-dependent QW absorption. We app
ly the method to the low-temperature photoluminescence spectra of a se
t of single QW p-i-n photodiodes at different electric fields. We show
that modeled emission spectra agree closely with measured spectra in
flatband conditions. We also observe a field-dependent loss in emissio
n intensity-leading to a reduction in Delta E(f) of several meV-which
we attribute mainly to carrier escape from the QW. The derived values
for field-dependent nonradiative efficiency are consistent with indepe
ndent measurements of low-temperature de photocurrent, and with a simp
le model for thermally assisted carrier escape, We show how the method
can be applied to electroluminescence spectra in order to investigate
the dependence of Delta E(f) on applied bias. (C) 1996 American Insti
tute of Physics.