A precise method is presented for measuring the refractive index of an
anisotropic prism with light polarized orthogonal to the prism axis w
hich is also a dielectric axis. Prisms have been cut from crystals of
the optically nonlinear 4-amino benzophenone with exceptionally low de
fect concentration as identified by synchrotron white light topography
. The linear refractive indices of these have been measured and fitted
to four-parameter Sellmeier equations to an accuracy of 7x10(-6)-3x10
(-3). The values are accurately verified by observation of the externa
l angle of incidence to a (001) plane required to meet the conditions
of type-I phase matching with a fundamental wavelength of 1064 nm. The
phase matching is of Hobden class six for this wavelength. In common
with similar organic molecular materials, the molecular charge transfe
r axis defines the most polarizable direction in the crystal, with the
C=O direction being much less significant. (C) 1996 American Institut
e of Physics.