NOVEL SPECTROMICROSCOPY - PT-GAP STUDIES BY SPATIALLY-RESOLVED INTERNAL PHOTOEMISSION WITH NEAR-FIELD OPTICS

Authors
ALMEIDA J ORTO TD COLUZZA C MARGARITONDO G BERGOSSI O SPAJER M COURJON D
Citation
J. Almeida et al., NOVEL SPECTROMICROSCOPY - PT-GAP STUDIES BY SPATIALLY-RESOLVED INTERNAL PHOTOEMISSION WITH NEAR-FIELD OPTICS, Applied physics letters, 69(16), 1996, pp. 2361-2363
Citations number
20
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
69
Issue
16
Year of publication
1996
Pages
2361 - 2363
Database
ISI
SICI code
0003-6951(1996)69:16<2361:NS-PSB>2.0.ZU;2-A
Abstract
The combination of internal photoemission and near-field optics is pro posed as a generally applicable approach to study the lateral variatio ns of solid interface properties such as energy barriers and electron- hole recombination rates. A successful test on Pt-GaP is described in which topographic and nontopographic phenomena are revealed, in partic ular recombination rate variations and small lateral changes of the Sc hottky barrier height. (C) 1996 American Institute of Physics.