INTERFACE STRUCTURE AND MAGNETIC AND ELECTRICAL-PROPERTIES OF FE TI MULTILAYERS/

Authors
CZAPKIEWICZ M STOBIECKI T KOPCEWICZ M
Citation
M. Czapkiewicz et al., INTERFACE STRUCTURE AND MAGNETIC AND ELECTRICAL-PROPERTIES OF FE TI MULTILAYERS/, Journal of magnetism and magnetic materials, 160, 1996, pp. 357-358
Citations number
7
Categorie Soggetti
Material Science","Physics, Condensed Matter
Journal title
Journal of magnetism and magnetic materials → ACNP
ISSN journal
03048853
Volume
160
Year of publication
1996
Pages
357 - 358
Database
ISI
SICI code
0304-8853(1996)160:<357:ISAMAE>2.0.ZU;2-6
Abstract
The interface structure of Fe/Ti multilayer films prepared by the rf s puttering technique was studied by XRD. It was found from diffraction, electrical conductivity and coercivity measurements that the amorphou s phase is formed during deposition and is distributed in the plane be tween the crystalline sublayers as well as in the grain boundaries.