EVIDENCE FOR ANGSTROM THICKNESS OF HTSC I SOLATED SUPERCONDUCTING LAYERS

Authors
Citation
Pn. Mikheenko, EVIDENCE FOR ANGSTROM THICKNESS OF HTSC I SOLATED SUPERCONDUCTING LAYERS, Fizika nizkih temperatur, 22(6), 1996, pp. 632-634
Citations number
28
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
01326414
Volume
22
Issue
6
Year of publication
1996
Pages
632 - 634
Database
ISI
SICI code
0132-6414(1996)22:6<632:EFATOH>2.0.ZU;2-3
Abstract
The effective thickness of YBa2Cu3Ox superconducting layers is evaluat ed. The abnormally large difference between the mean-field critical te mperature and the temperature of Berezinskii-Kocterlitz-Thouless (BKT) transition in orle-unit-cell films, Y/Pr superlattices and polycrysta l samples with destroyed CuO2 planes, is explained. The dynamics of th e BKT temperature with varying the number of the layered YBa2Cu3Ox uni t cells is described. Art expression that relates the BKT transition t emperature to sample resistance per square area and is appropriate For HTSC is derived.