RECONSTRUCTION OF SURFACE TOPOGRAPHIES BY SCANNING ELECTRON-MICROSCOPY FOR APPLICATION IN FRACTURE RESEARCH

Authors
STAMPFL J SCHERER S GRUBER M KOLEDNIK O
Citation
J. Stampfl et al., RECONSTRUCTION OF SURFACE TOPOGRAPHIES BY SCANNING ELECTRON-MICROSCOPY FOR APPLICATION IN FRACTURE RESEARCH, Applied physics A: Materials science & processing, 63(4), 1996, pp. 341-346
Citations number
20
Categorie Soggetti
Physics, Applied
Journal title
Applied physics A: Materials science & processing → ACNP
ISSN journal
09478396
Volume
63
Issue
4
Year of publication
1996
Pages
341 - 346
Database
ISI
SICI code
0947-8396(1996)63:4<341:ROSTBS>2.0.ZU;2-T
Abstract
Stereoscopic scanning electron micrographs can be used to reconstruct the microscopic topography of material surfaces. By applying a system for automatic image processing we can obtain Digital Elevation Models (DEMs) of the investigated surface. These DEMs are used to measure the degree of deformation on metallic fracture surfaces. By modelling the deformation the amount of plastic energy that is necessary to shape t he microductile fracture surface can be calculated. These values are c ompared with experimentally obtained results.