SPIN-DIFFUSION LENGTHS OF CU1-XNIX USING CURRENT PERPENDICULAR TO PLANE MAGNETORESISTANCE MEASUREMENTS OF MAGNETIC MULTILAYERS

Citation
Sy. Hsu et al., SPIN-DIFFUSION LENGTHS OF CU1-XNIX USING CURRENT PERPENDICULAR TO PLANE MAGNETORESISTANCE MEASUREMENTS OF MAGNETIC MULTILAYERS, Physical review. B, Condensed matter, 54(13), 1996, pp. 9027-9030
Citations number
27
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
54
Issue
13
Year of publication
1996
Pages
9027 - 9030
Database
ISI
SICI code
0163-1829(1996)54:13<9027:SLOCUC>2.0.ZU;2-B
Abstract
Spin-relaxation effects are generally believed to have a strong influe nce on giant magnetoresistance of ferromagnetic/noble-metal multilayer s. We have measured current perpendicular to plane magnetoresistances (CPP MR's) of sputtered Co/Cu1-xNix multilayers with x=0.06, 0.10, 0.1 4, and 0.23. Our results indicate that the spin-diffusion length of Cu Ni is reduced as the concentration of Ni increases. Spin-diffusion len gths obtained from fitting the CPP MR to Valet-Fert theory are in a go od agreement with theoretical calculations from spin-orbit scattering. Assuming that the permalloy(Py)-Cu interface in Py/Cu multilayers res embles a CuNi alloy, we can conclude that there will be spin-flip scat tering at a Py-Cu interface, but we expect its effect on the MR to be small.