The absolute magnetic moments of thin Cr overlayers on Fe(100) are dir
ectly determined by energy-resolved spin-polarized secondary-electron
emission. Spin-dependent attenuation of low-energy secondary electrons
is quantitatively treated, following a model by Siegmann, to extract
magnetic depth profiles in the adlayer. The first monolayer of Cr coup
les antiferromagnetically to the Fe substrate and exhibits a maximum m
agnetic moment of 1.8+/-0.2 mu(B), per atom for a submonolayer coverag
e. Subsequent Cr layers show a positive magnetization.