TRACK-EDGE READ-WRITE EFFECT OF INDUCTIVE MR DUAL ELEMENT HEADS/

The effect of side-writing from the inductive writer on the read-back properties of MR heads is studied by recording physics analysis and mi cromagnetic simulation, Inductive write heads with and without pole tr imming, and MR read heads with overlay and contiguous-junction designs are investigated. It is found that the contiguous-junction MR reader is robust against written track-edge perturbations, and in general, tr ack-trimming for both the write head and the read sensor is beneficial for optimum performance.