A MICROSTRUCTURAL STUDY OF PTCO THIN-FILMS

Citation
S. Casey et al., A MICROSTRUCTURAL STUDY OF PTCO THIN-FILMS, IEEE transactions on magnetics, 32(5), 1996, pp. 3831-3833
Citations number
3
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189464
Volume
32
Issue
5
Year of publication
1996
Part
1
Pages
3831 - 3833
Database
ISI
SICI code
0018-9464(1996)32:5<3831:AMSOPT>2.0.ZU;2-#
Abstract
PtxCo(1-x) thin films where 0.15 less than or equal to x less than or equal to 0.35 have a potential use in ultra high density longitudinal recording and have been studied using various TEM techniques. The thin films have been deposited onto glass, Si/Si3N4 and Si3N4 windowed sub strates. It was found that the microstructure, crystallography and mag netic properties varied a great deal depending on which substrate the films were deposited onto.