STRUCTURAL, MAGNETIC AND MAGNETOOPTIC PROPERTIES OF MNBIPT THIN-FILMS

C-axis oriented MnBiPt films have been prepared by sequentially deposi ting Bi, Mn, and Pt layers. The crystalline structure as well as the r oughness of the films is strongly influenced due to Pt interlayers. A change from 50 nm sized fragment islands to a plateau-like structure w ith increasing Pt content coinciding with a shift to higher coercive f ields and a decrease in magnetization and Kerr rotation lends to an en hanced reflectivity. Tile plateau-like structure is observed with scan ning force microscopy. The ratio of Kerr rotation to magnetization is constant to within 10 % as a function of Pt thickness indicating that Pt does not contribute much to the Kerr effect.