MEASUREMENT OF THERMAL-CONDUCTIVITIES OF SIN AND TBFECO FILMS

Authors
KIM SS AHN YM LEE KG GILL BL SHIN SC
Citation
Ss. Kim et al., MEASUREMENT OF THERMAL-CONDUCTIVITIES OF SIN AND TBFECO FILMS, IEEE transactions on magnetics, 32(5), 1996, pp. 4093-4095
Citations number
5
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
Journal title
IEEE transactions on magnetics → ACNP
ISSN journal
00189464
Volume
32
Issue
5
Year of publication
1996
Part
1
Pages
4093 - 4095
Database
ISI
SICI code
0018-9464(1996)32:5<4093:MOTOSA>2.0.ZU;2-J
Abstract
The effective thermal conductivities of SiN and TbFeCo thin films were measured by comparing the length and width of polarizing microscope i mage of thermo-magnetically written domains with those of calculated i sotherms for the trilayer structure of substrate/Si3N4/Tb22Fe70C08/Si3 N4. The resulting data were applied to the quadrillayer structure of s ubstrate/Si3N4/Tb22Fe70C08/Si3N4/Al, and the length of calculated isot herms was turned out to agree with that of written domain.